The ED-XRF Analysis is a method for measuring the thickness of coatings and for analysing materials.
can be used for the qualitative and quantitative determination of the elemental composition of a material sample as well as for measuring coating thickness and coating systems. In both laboratory and industrial environments, the ED-XRF method is now well established and can be readily utilised with modern equipment.ITRI Innovation uses a Fischerscope XDAL XRF for ED-XRF analysis.
ITRI’s UK laboratory is experienced at providing thickness measurement and material analysis, with a fast turnaround, at very competitive rates using a Fischerscope XDAL XRF.
A short video about ED-XRF analysis can be viewed below.
To discuss your potential requirements, call Mark on 01727 871316.